Correlating structure, conductance, and mechanics of silver atomic-scale contacts

ACS Nano

Volumn 7, Issue 4, 2013, Pages 3706-3712

  Aradhya, Sriharsha V ^a   Frei, Michael ^a   Halbritter, András ^b   Venkataraman, Latha ^a  

^a Department of Earth and Environmental Sciences   (United States)

^b BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

Author keywords

Ag point contacts; atomic defects; bond rupture forces; break junctions; electronic transport

Indexed keywords

ATOMIC DEFECTS; ATOMIC-SCALE CONTACTS; BOND RUPTURE; BREAK-JUNCTIONS; CROSS CORRELATION TECHNIQUES; ELECTRONIC TRANSPORT; OXYGEN CONTAMINATION; STRUCTURAL EVOLUTION;

ATOMS; OXYGEN;

SILVER;

METAL NANOPARTICLE; SILVER;

ARTICLE; CHEMICAL MODEL; CHEMICAL STRUCTURE; CHEMISTRY; COMPUTER SIMULATION; CONFORMATION; ELECTRIC CONDUCTIVITY; ELECTRODE; EQUIPMENT DESIGN; EQUIPMENT FAILURE; MATERIALS TESTING; PARTICLE SIZE; STATISTICS; SURFACE PROPERTY; TENSILE STRENGTH; ULTRASTRUCTURE; YOUNG MODULUS; DEVICE FAILURE ANALYSIS;

COMPUTER SIMULATION; ELASTIC MODULUS; ELECTRIC CONDUCTIVITY; ELECTRODES; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MATERIALS TESTING; METAL NANOPARTICLES; MODELS, CHEMICAL; MODELS, MOLECULAR; MOLECULAR CONFORMATION; PARTICLE SIZE; SILVER; STATISTICS AS TOPIC; SURFACE PROPERTIES; TENSILE STRENGTH;

EID: 84876545528     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn4007187     Document Type: Article

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