Neural network method to model nanoscale MOSFET characteristics

Journal of Computational and Theoretical Nanoscience

Volumn 9, Issue 12, 2012, Pages 2037-2041

  Fang, Ming ^a   He, Jin ^a   Zhang, Xukai ^a   Ma, Yong ^a   Chen, Qin ^a   Ye, Yun ^a   Wang, Cheng ^a   Liang, Hailang ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

Circuit Simulation; Modeling; Nanoscale MOSFET; Neural Network Method

Indexed keywords

EXTRACTION PARAMETERS; MEASURE DATA; METHOD MODEL; MOSFET TRANSISTORS; NANOSCALE MOSFETS; NEURAL NETWORK METHOD; RELATIVE ERRORS;

CIRCUIT SIMULATION; MODELS; NANOTECHNOLOGY; NEURAL NETWORKS;

MOSFET DEVICES;

EID: 84876533348     PISSN: 15461955     EISSN: 15461963     Source Type: Journal    
DOI: 10.1166/jctn.2012.2611     Document Type: Article

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