Impact of charge-coupled device size on axial measurement error in digital holographic system

Optics Letters

Volumn 38, Issue 8, 2013, Pages 1194-1196

  Hao, Yan ^a   Asundi, Anand ^b  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

3-D MEASUREMENT; AXIAL RESOLUTIONS; CCD CHIP; DH SYSTEMS; DIGITAL HOLOGRAPHIC SYSTEMS; DIGITAL HOLOGRAPHY; MEASUREMENT ACCURACY;

COMPUTER GENERATED HOLOGRAPHY;

MEASUREMENT ERRORS;

EID: 84876516044     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.38.001194     Document Type: Article

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