Improved ionic conductivity in strained yttria-stabilized zirconia thin films

Applied Physics Letters

Volumn 102, Issue 14, 2013, Pages

  Jiang, Jun ^a   Hu, Xiaocao ^a   Shen, Weida ^b   Ni, Chaoying ^a   Hertz, Joshua L ^a,b  

^a DUPONT COMPANY   (United States)

^b UNIVERSITY OF DELAWARE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BULK SAMPLES; OUT-OF-PLANE LATTICE PARAMETERS; OXYGEN-ION CONDUCTIVITY; RF-SPUTTERING; YTTRIA-STABILIZED ZIRCONIA THIN FILMS;

ACTIVATION ENERGY; EDGE DISLOCATIONS; EPITAXIAL GROWTH; IONIC CONDUCTIVITY; THIN FILMS; YTTRIUM ALLOYS; ZIRCONIA;

YTTRIA STABILIZED ZIRCONIA;

EID: 84876386877     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4801649     Document Type: Article

References (27)

1. N. Q. Minh, J. Am. Ceram. Soc. 76, 563 (1993). 10.1111/j.1151-2916.1993. tb03645.x
2. E. D. Wachsman and K. T. Lee, Science 334, 935 (2011). 10.1126/science.1204090
3. M. Gerstl, T. Fromling, A. Schintlmeister, H. Hutter, and J. Fleig, Solid State Ion. 184, 23 (2011). 10.1016/j.ssi.2010.08.013
4. M. Tsuchiya, A. M. Minor, and S. Ramanathan, Philos. Mag. 87, 5673 (2007). 10.1080/14786430701708349
5. K. V. Hansen, K. Norrman, and M. Mogensen, J. Electrochem. Soc. 151, A1436 (2004). 10.1149/1.1779630
6. R. Radhakrishnan, A. V. Virkar, and S. C. Singhal, J. Electrochem. Soc. 152, A927 (2005). 10.1149/1.1885325
7. J. L. Hertz, A. Rothschild, and H. L. Tuller, J. Electroceram. 22, 428 (2009). 10.1007/s10832-008-9475-5
8. A. Evans, A. Bieberle-Hutter, J. L. M. Rupp, and L. J. Gauckler, J. Power Sources 194, 119 (2009). 10.1016/j.jpowsour.2009.03.048
9. C. D. Baertsch, K. F. Jensen, J. L. Hertz, H. L. Tuller, S. T. Vengallatore, S. M. Spearing, and M. A. Schmidt, J. Mater. Res. 19, 2604 (2004). 10.1557/JMR.2004.0350
10. H. Huang, M. Nakamura, P. C. Su, R. Fasching, Y. Saito, and F. B. Prinz, J. Electrochem. Soc. 154, B20 (2007). 10.1149/1.2372592
11. S. De Souza, S. J. Visco, and L. C. DeJonghe, J. Electrochem. Soc. 144, L35 (1997). 10.1149/1.1837484
12. A. C. Johnson, A. Baclig, D. V. Harburg, B. K. Lai, and S. Ramanathan, J. Power Sources 195, 1149 (2010). 10.1016/j.jpowsour.2009.08.066
13. X. Guo E. Vasco, S. B. Mi, K. Szot, E. Wachsman, and R. Waser, Acta Mater. 53, 5161 (2005). 10.1016/j.actamat.2005.07.033
14. E. Navickas, M. Gerstl, G. Friedbacher, F. Kubel, and J. Fleig, Solid State Ion. 211, 58 (2012). 10.1016/j.ssi.2012.01.007
15. J. H. Joo and G. M. Choi, Solid State Ion. 177, 1053 (2006). 10.1016/j.ssi.2006.04.008
16. J. Garcia-Barriocanal, A. Rivera-Calzada, M. Varela, Z. Sefrioui, E. Iborra, C. Leon, S. J. Pennycook, and J. Santamaria, Science 321, 676 (2008). 10.1126/science.1156393
17. M. Sillassen, P. Eklund, N. Pryds, E. Johnson, U. Helmersson, and J. Bottiger, Adv. Funct. Mater. 20, 3194 (2010). 10.1002/adfm.201090088
18. I. Kosacki, C. M. Rouleau, P. F. Becher, J. Bentley, and D. H. Lowndes, Electrochem. Solid-State Lett. 7, A459 (2004). 10.1149/1.1809556
19. A. Karthikeyan, C. L. Chang, and S. Ramanathan, Appl. Phys. Lett. 89, 183116 (2006). 10.1063/1.2385211
20. J. Jiang, W. D. Shen, and J. L. Hertz, Thin Solid Films 522, 66 (2012). 10.1016/j.tsf.2012.09.013
21. R. A. De Souza, M. J. Pietrowski, U. Anselmi-Tamburini, S. Kim, Z. A. Munir, and M. Martin, Phys. Chem. Chem. Phys. 10, 2067 (2008). 10.1039/b719363g
22. See supplementary material at http://dx.doi.org/10.1063/1.4801649 E-APPLAB-102-094315 for: example impedance spectra, an image and description of the equivalent circuit, figures and text describing the evolution of conductivity in the 9 mol. YSZ films during measurement at high temperature, and comparative conductivity values of 14 mol. YSZ films.
23. S. K. R. S. Sankaranarayanan and S. Ramanathan, J. Chem. Phys. 134, 064703 (2011). 10.1063/1.3549891
24. N. Schichtel, C. Korte, D. Hesse, and J. Janek, Phys. Chem. Chem. Phys. 11, 3043 (2009). 10.1039/b900148d
25. C. Korte, N. Schichtel, D. Hesse, and J. Janek, Monatsh. Chem. 140, 1069 (2009). 10.1007/s00706-009-0125-7
26. A. Kushima and B. Yildiz, J. Mater. Chem. 20, 4809 (2010). 10.1039/c000259c
27. K. Otsuka, A. Kuwabara, A. Nakamura, T. Yamamoto, K. Matsunaga, and Y. Ikuhara, Appl. Phys. Lett. 82, 877 (2003). 10.1063/1.1544440