Double phase-plate setup for chromatic aberration compensation for resonant X-ray diffraction experiments

Journal of Physics: Conference Series

Volumn 425, Issue PART 13, 2013, Pages

  Inami, T ^a   Michimura, S ^a,b   Matsumura, T ^c  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

^b SAITAMA UNIVERSITY   (Japan)

^c HIROSHIMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; POLARIZATION; SYNCHROTRON RADIATION; SYNCHROTRONS;

CHROMATIC ABERRATION; DEGREE OF LINEAR POLARIZATION; LINEAR POLARIZATION; LINEARLY POLARIZED; LOW ENERGY X RAYS; RESONANT X-RAY DIFFRACTION; SYNCHROTRON SOURCE; X RAY INTENSITY;

X RAY DIFFRACTION;

EID: 84876222428     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/425/13/132011     Document Type: Conference Paper

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