A semi-automated positioning system for contact-mode atomic force microscopy (AFM)

IEEE Transactions on Automation Science and Engineering

Volumn 10, Issue 2, 2013, Pages 462-465

  Roy, Rajarshi ^a   Chen, Wenjin ^b   Cong, Lei ^b   Goodell, Lauri A ^c   Foran, David J ^b   Desai, Jaydev P ^a  

^a UNIVERSITY OF MARYLAND   (United States)

^b RUTGERS CANCER INSTITUTE OF NEW JERSEY   (United States)

^c RUTGERS ROBERT WOOD JOHNSON MEDICAL SCHOOL   (United States)

Author keywords

biomechanicsAtomic force microscopy (AFM)

Indexed keywords

AFM; CONTACT MODE ATOMIC FORCE MICROSCOPY; HETEROGENEOUS TISSUES; INDENTATION EXPERIMENT; MECHANICAL PROPERTIES OF CELLS; MICRO POSITIONING; POSITIONING SYSTEM; TISSUE REGISTRATIONS;

ATOMIC FORCE MICROSCOPY; EXPERIMENTS; MECHANICAL PROPERTIES; MEDICAL IMAGING; TISSUE;

BIOMECHANICS;

EID: 84876145737     PISSN: 15455955     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASE.2012.2226154     Document Type: Article

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