Phases measure of image sharpness based on quaternion wavelet

Pattern Recognition Letters

Volumn 34, Issue 9, 2013, Pages 1063-1070

  Liu, Yipeng ^a   Jin, Jing ^a   Wang, Qiang ^a   Shen, Yi ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

2D phase; Gaussian blur; Image sharpness metric; Quaternion wavelet transform

Indexed keywords

2D PHASE; BETTER PERFORMANCE; GAUSSIAN BLUR; IMAGE GRADIENTS; IMAGE SHARPNESS; IMPORTANT FEATURES; SHARPNESS METRICS; WAVELET COEFFICIENTS;

EIGENVALUES AND EIGENFUNCTIONS;

WAVELET DECOMPOSITION;

EID: 84876116452     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patrec.2013.03.002     Document Type: Article

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