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Volumn 62, Issue 5, 2013, Pages 1008-1016

Face based recognition algorithms: A first step toward a metrological characterization

Author keywords

Curve fitting; decision support systems; face recognition; image classification; measurement uncertainty

Indexed keywords

FALSE NEGATIVES; MEASUREMENT UNCERTAINTY; METROLOGICAL CHARACTERIZATION; PERFORMANCE CHARACTERIZATION; RECOGNITION ALGORITHM; RECOGNITION SYSTEMS; RELIABILITY INDEX; SCIENTIFIC COMMUNITY;

EID: 84875978165     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2013.2252856     Document Type: Article
Times cited : (30)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.