A review on face recognition techniques

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8760, Issue , 2013, Pages

  Choudhary, Kritika ^a   Goel, Nidhi ^a  

^a DELHI TECHNOLOGICAL UNIVERSITY   (India)

Author keywords

Dimensionality reduction; Face recognition; Pattern recognition; Recognition rate

Indexed keywords

DIMENSIONALITY REDUCTION; FACE RECOGNITION TECHNIQUE; FACIAL EXPRESSIONS; RECOGNITION RATE; STRUCTURAL COMPONENT; TECHNIQUES USED;

COMMUNICATION; PATTERN RECOGNITION; SYSTEMS ANALYSIS;

FACE RECOGNITION;

EID: 84875960755     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.2012238     Document Type: Conference Paper

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