Steganalysis by ensemble classifiers with boosting by regression, and post-selection of features

Proceedings - International Conference on Image Processing, ICIP

Volumn , Issue , 2012, Pages 1133-1136

  Chaumont, Marc ^a,b,c   Kouider, Sarra ^b,c  

^a CC 051 Pl E Bataillon   (France)

^b UNIV MONTPELLIER   (France)

^c CNRS   (France)

Author keywords

Boosting; Ensemble classifiers; Features selection; Steganlaysis

Indexed keywords

BOOSTING; ENSEMBLE CLASSIFIERS; FEATURES SELECTION; PROBABILITY OF ERRORS; STEGANALYSIS; STEGANLAYSIS; WEAK CLASSIFIERS;

IMAGE PROCESSING; STEGANOGRAPHY;

FEATURE EXTRACTION;

EID: 84875866796     PISSN: 15224880     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIP.2012.6467064     Document Type: Conference Paper

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