A new object based quality metric based on SIFT and SSIM

Proceedings - International Conference on Image Processing, ICIP

Volumn , Issue , 2012, Pages 1493-1496

  Decombas, Marc ^a,b   Dufaux, Frederic ^b   Renan, Erwann ^a   Pesquet Popescu, Beatrice ^b   Capman, Francois ^a  

^a THALES COMMUNICATIONS   (France)

^b TELECOM PARISTECH   (France)

Author keywords

Object based metric; SIFT; SSIM; subjective evaluation

Indexed keywords

COMPRESSION ARTIFACTS; FULL REFERENCES; GEOMETRIC DISTORTION; MATCHING DISTANCES; OBJECT BASED; QUALITY METRICES; SCALE INVARIANT FEATURE TRANSFORMS; SEMANTIC CODING; SIFT; SPEARMAN CORRELATION; SSIM; STANDARD DEVIATION; STRUCTURAL SIMILARITY; SUBJECTIVE EVALUATIONS; VISUAL QUALITY METRICS;

GEOMETRY; IMAGE PROCESSING;

QUALITY CONTROL;

EID: 84875864249     PISSN: 15224880     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIP.2012.6467154     Document Type: Conference Paper

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