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Volumn 18, Issue 6, 2013, Pages
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Structured illumination microscopy using random intensity incoherent reflectance
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Author keywords
optical sectioning; random illumination; reflectance microscopy; structured illumination
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Indexed keywords
HIGH-CONTRAST IMAGES;
LOW-COST SOLUTION;
OPTICAL SECTIONING;
RANDOM ILLUMINATION;
RANDOM PROJECTIONS;
SPATIAL FREQUENCY;
STRUCTURED ILLUMINATION;
STRUCTURED ILLUMINATION MICROSCOPY;
LASER SAFETY;
LIGHT EMITTING DIODES;
LIGHT SOURCES;
REFLECTION;
ARTICLE;
ARTIFACT;
DIFFUSION;
EQUIPMENT DESIGN;
HISTOLOGY;
HUMAN;
ILLUMINATION;
INSTRUMENTATION;
METHODOLOGY;
MICROSCOPY;
PLANT LEAF;
SKIN;
ARTIFACTS;
DIFFUSION;
EQUIPMENT DESIGN;
HUMANS;
LIGHTING;
MICROSCOPY;
PLANT LEAVES;
SKIN;
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EID: 84875813319
PISSN: 10833668
EISSN: 15602281
Source Type: Journal
DOI: 10.1117/1.JBO.18.6.061216 Document Type: Article |
Times cited : (10)
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References (11)
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