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Volumn 18, Issue 6, 2013, Pages

Structured illumination microscopy using random intensity incoherent reflectance

Author keywords

optical sectioning; random illumination; reflectance microscopy; structured illumination

Indexed keywords

HIGH-CONTRAST IMAGES; LOW-COST SOLUTION; OPTICAL SECTIONING; RANDOM ILLUMINATION; RANDOM PROJECTIONS; SPATIAL FREQUENCY; STRUCTURED ILLUMINATION; STRUCTURED ILLUMINATION MICROSCOPY;

EID: 84875813319     PISSN: 10833668     EISSN: 15602281     Source Type: Journal    
DOI: 10.1117/1.JBO.18.6.061216     Document Type: Article
Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.