High-resolution electron microscopy and X-ray diffraction study of intergrowth structures in α-and β-type YbAlB4 single crystals

Philosophical Magazine

Volumn 93, Issue 9, 2013, Pages 1054-1064

  Yubuta, Kunio ^a   Mori, Takao ^b   Okada, Shigeru ^c   Prots, Yurii ^d   Borrmann, Horst ^d   Grin, Yuri ^d   Shishido, Toetsu ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^c KOKUSHIKAN UNIVERSITY   (Japan)

^d MAX PLANCK INSTITUTE FOR CHEMICAL PHYSICS OF SOLIDS   (Germany)

Author keywords

electron diffraction; high resolution electron microscopy; intergrowth; rare earth aluminoboride

Indexed keywords

COMMON STRUCTURES; HIGH RESOLUTION IMAGE; INTERGROWTH; INTERGROWTH STRUCTURE; POLYCRYSTALLINE SAMPLES; STRUCTURAL FEATURE; STRUCTURAL MOTIFS; X-RAY DIFFRACTION STUDIES;

ELECTRON DIFFRACTION; ELECTRON MICROSCOPES; LAMELLAR STRUCTURES; SINGLE CRYSTALS;

X RAY DIFFRACTION;

EID: 84875779983     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786435.2012.741727     Document Type: Article

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