Erratum: Mapping nanoscale elasticity and dissipation using dual frequency contact resonance AFM (Nanotechnology (2011) 22 (355705))

Nanotechnology

Volumn 24, Issue 15, 2013, Pages

  Gannepalli, A ^a   Yablon, D G ^b   Tsou, A H ^b   Proksch, R ^a  

^a United States   (United States)

^b EXXONMOBIL UPSTREAM RESEARCH COMPANY   (United States)

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EID: 84875643988     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/15/159501     Document Type: Erratum

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