Investigation on optical properties of NiMn2O4 films by spectroscopic ellipsometry

Solid State Communications

Volumn 159, Issue , 2013, Pages 32-35

  Zhang, L B ^a   Hou, Y ^a   Zhou, W ^a   Gao, Y Q ^a   Wu, J ^a   Huang, Z M ^a   Chu, J H ^a  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

Author keywords

A. NiMn2O4; D. Optical properties; D. Oxidation; E. Spectroscopic ellipsometry

Indexed keywords

A. NIMN2O4; ABSORPTION CO-EFFICIENT; CHEMICAL SOLUTION DEPOSITION METHOD; DISPERSION FUNCTION; EXPERIMENTAL DATUM; EXTINCTION COEFFICIENTS; OPTOELECTRONIC APPLICATIONS; WAVELENGTH RANGES;

REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X RAY DIFFRACTION;

SPECTROSCOPIC ELLIPSOMETRY;

EID: 84875452777     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2013.01.022     Document Type: Article

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