Low temperature degradation and reliability of one-piece ceramic oral implants with a porous surface

Dental Materials

Volumn 29, Issue 4, 2013, Pages 389-397

  Sanon, Clarisse ^a,b   Chevalier, Jérôme ^a   Douillard, Thierry ^a   Kohal, Ralf J ^c   Coelho, Paulo G ^d   Hjerppe, Jenni ^d   Silva, Nelson R F A ^e  

^a UNIVERSITÉ DE LYON   (France)

^b UNIVERSITÉ LYON 1   (France)

^c UNIVERSITY OF FREIBURG   (Germany)

^d NEW YORK UNIVERSITY COLLEGE OF DENTISTRY   (United States)

^e FEDERAL UNIVERSITY OF MINAS GERAIS   (Brazil)

Author keywords

Cracks; Dental implants; Fatigue; Focused ion beam; Reliability; Surface modification; Transformation; Zirconia

Indexed keywords

ACCELERATED AGING TEST; FATIGUE PERFORMANCE; FATIGUE RELIABILITY; FATIGUE STRENGTH; LOW-TEMPERATURE DEGRADATIONS; RELIABILITY LEVEL; TETRAGONAL-TO-MONOCLINIC TRANSFORMATION; TRANSFORMATION;

CAPILLARY FLOW; CRACKS; DENTAL PROSTHESES; FATIGUE OF MATERIALS; FATIGUE TESTING; FOCUSED ION BEAMS; RELIABILITY; SURFACE TREATMENT; TEMPERATURE; X RAY DIFFRACTION; YTTRIUM ALLOYS;

ZIRCONIA;

ALUMINUM OXIDE; BIOMATERIAL; TOOTH IMPLANT; YTTRIA STABILIZED TETRAGONAL ZIRCONIA; YTTRIUM; ZIRCONIUM;

CHEMISTRY; DENTAL PROCEDURE; DEVICE FAILURE ANALYSIS; POROSITY; PROCEDURES; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; TEMPERATURE; TOOTH IMPLANT; X RAY DIFFRACTION; ARTICLE; EQUIPMENT FAILURE; METHODOLOGY;

ALUMINUM OXIDE; COATED MATERIALS, BIOCOMPATIBLE; DENTAL IMPLANTS; DENTAL STRESS ANALYSIS; EQUIPMENT FAILURE ANALYSIS; MICROSCOPY, ELECTRON, SCANNING; POROSITY; SURFACE PROPERTIES; TEMPERATURE; X-RAY DIFFRACTION; YTTRIUM; ZIRCONIUM;

EID: 84875212608     PISSN: 01095641     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.dental.2013.01.007     Document Type: Article

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