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Volumn 110, Issue 11, 2013, Pages

Strength of Shock-Loaded Single-Crystal Tantalum [100] Determined using in Situ Broadband X-Ray Laue Diffraction

(20) Comley, A J a,b Maddox, B R a Rudd, R E a Prisbrey, S T a Hawreliak, J A a Orlikowski, D A a Peterson, S C a Satcher, J H a Elsholz, A J a Park, H S a Remington, B A a Bazin, N b Foster, J M b Graham, P b Park, N b Rosen, P A b Rothman, S R b Higginbotham, A c Suggit, M c Wark, J S c

a LAWRENCE LIVERMORE NATIONAL LABORATORY (United States)

b AWE (United Kingdom)

c UNIVERSITY OF OXFORD (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FIRST PRINCIPLES; LAUE DIFFRACTION; LENGTH SCALE; MULTISCALES; SHOCK PRESSURE; STRAIN STATE; STRENGTH MODELS;

DIFFRACTION;

TANTALUM;

EID: 84875043134 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.110.115501 Document Type: Article

Times cited : (60)

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