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Volumn 13, Issue 3, 2013, Pages 1179-1184

A natural topological insulator

Author keywords

angle resolved photoemission spectroscopy; nanosheet; Natural topological insulator; universal conductance fluctuations; weak antilocalization

Indexed keywords

ANGLE RESOLVED PHOTOEMISSION SPECTROSCOPY; ELECTRONIC APPLICATION; ELECTRONIC CHARACTERISTICS; MECHANICAL EXFOLIATION; NATURALLY OCCURRING; TOPOLOGICAL INSULATORS; UNIVERSAL CONDUCTANCE FLUCTUATIONS; WEAK ANTILOCALIZATION;

EID: 84875000800     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl304583m     Document Type: Article
Times cited : (39)

References (31)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.