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Volumn 110, Issue 11, 2013, Pages

Robust formation of skyrmions and topological hall effect anomaly in epitaxial thin films of MnSi

(9) Li, Yufan a,b Kanazawa, N a Yu, X Z c Tsukazaki, A a Kawasaki, M a,c Ichikawa, M a Jin, X F b Kagawa, F a Tokura, Y a,c

a UNIVERSITY OF TOKYO (Japan)

b FUDAN UNIVERSITY (China)

c RIKEN (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BULK SAMPLES; EPITAXIAL THIN FILMS; LORENTZ TRANSMISSION ELECTRON MICROSCOPY; MAGNETO TRANSPORT PROPERTIES; SI(111) SUBSTRATE; SKYRMIONS;

EPITAXIAL FILMS; HALL EFFECT; TOPOLOGY; TRANSMISSION ELECTRON MICROSCOPY;

EPITAXIAL GROWTH;

EID: 84874970232 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.110.117202 Document Type: Article

Times cited : (388)

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