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Journal of Analytical Atomic Spectrometry

Volumn 28, Issue 4, 2013, Pages 606-612

Measurement on high-precision boron isotope of silicate materials by a single column purification method and MC-ICP-MS

(7) Gangjian, Wei a Jingxian, Wei a,b Ying, Liu a Ting, Ke a,b Zhongyuan, Ren a Jinlong, Ma a Yigang, Xu a

a GUANGZHOU INSTITUTE OF GEOCHEMISTRY (China)

b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL ERRORS; BORON CONTAMINATION; CHEMICAL TREATMENTS; LONG-TERM RESULTS; MULTI-COLLECTOR INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; PURIFICATION METHOD; SILICATE MATERIAL; SIMPLIFIED PROCEDURE;

INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; ION EXCHANGE; ISOTOPES; MASS SPECTROMETERS; PURIFICATION; SAPPHIRE; SILICATE MINERALS;

BORON;

EID: 84874965751 PISSN: 02679477 EISSN: 13645544 Source Type: Journal
DOI: 10.1039/c3ja30333k Document Type: Article

Times cited : (77)

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