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Volumn 121, Issue 1411, 2013, Pages 287-290

Development of a synchrotron powder diffractometer with a one-dimensional X-ray detector for analysis of advanced materials

(4) Tanaka, Masahiko a Katsuya, Yoshio a Matsushita, Yoshitaka a Sakata, Osami a

a NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

Author keywords

Crystal structure; Full automatic measurement; One dimensional X ray detector; Powder diffraction; Synchrotron radiation

Indexed keywords

CRYSTAL STRUCTURE; DETECTORS; DIFFRACTION; RIETVELD METHOD; SYNCHROTRON RADIATION; SYNCHROTRONS; X RAY APPARATUS; X RAY DIFFRACTION;

DEBYE-SCHERRER CAMERA; HIGH ANGULAR RESOLUTIONS; ONE-DIMENSIONAL DETECTORS; POWDER DIFFRACTION; POWDER DIFFRACTOMETERS; POWDER X RAY DIFFRACTION; SAMPLE-TO-DETECTOR DISTANCE; X-RAY DETECTOR;

DIFFRACTOMETERS;

EID: 84874927755 PISSN: 18820743 EISSN: 13486535 Source Type: Journal
DOI: 10.2109/jcersj2.121.287 Document Type: Article

Times cited : (79)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.