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Volumn 58, Issue 212, 2012, Pages 1245-1252

Grain-size evolution of polar firn: A new empirical grain growth parameterization based on X-ray microcomputer tomography measurements

Author keywords

[No Author keywords available]

Indexed keywords

FIRN; GRAIN SIZE; MICROSTRUCTURE; PARAMETERIZATION; TEMPERATURE GRADIENT; TOMOGRAPHY; X-RAY;

EID: 84874860749     PISSN: 00221430     EISSN: None     Source Type: Journal    
DOI: 10.3189/2012JoG11J256     Document Type: Article
Times cited : (21)

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