On including quality in applied automatic gait recognition

Proceedings - International Conference on Pattern Recognition

Volumn , Issue , 2012, Pages 3272-3275

  Matovski, D S ^a   Nixon, M ^a   Mahmoodi, S ^a   Mansfield, T ^b  

^a UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

^b NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ARBITRARY ENVIRONMENT; GAIT CYCLES; GAIT RECOGNITION; IMPROVE PERFORMANCE; IMPROVE-A; NEW APPROACHES; QUALITY METRICS; RECOGNITION SYSTEMS; SILHOUETTE EXTRACTION;

GAIT ANALYSIS; PATTERN RECOGNITION;

QUALITY CONTROL;

EID: 84874566041     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

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