Optical properties of ceria-zirconia epitaxial films grown from chemical solutions

Materials Chemistry and Physics

Volumn 138, Issue 2-3, 2013, Pages 462-467

  Pena Rodriguez O ^a,b,c   Sanchez Valdes C F ^a   Garriga, M ^a   Alonso, M I ^a   Obradors, X ^a   Puig, T ^a  

^a INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

^b CENTRO DE MICROANÁLISIS DE MATERIALES   (Spain)

^c INSTITUTO DE ÓPTICA   (Spain)

Author keywords

Optical properties; Organometallic compounds; Polarimeters and ellipsometers; Thin films

Indexed keywords

CERIA ZIRCONIA SOLID SOLUTION; CERIA-ZIRCONIA; CERIUM CONCENTRATION; CHEMICAL SOLUTION DEPOSITION; CHEMICAL SOLUTIONS; COMPOSITIONAL DEPENDENCE; ELLIPSOMETRY MEASUREMENTS; EPITAXIAL THIN FILMS; HIGH QUALITY; HIGH-DENSITY FILMS; LINEAR DEPENDENCE; MIXED OXIDE; ORGANOMETALLIC COMPOUNDS; POLARIMETERS AND ELLIPSOMETERS; TAUC-LORENTZ MODELS; VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY; YTTRIA-STABILIZED ZIRCONIAS (YSZ);

ATOMIC FORCE MICROSCOPY; CERIUM ALLOYS; EPITAXIAL GROWTH; OPTICAL CONSTANTS; OPTICAL PROPERTIES; ORGANOMETALLICS; OXIDE FILMS; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS; X RAY DIFFRACTION; YTTRIA STABILIZED ZIRCONIA; ZIRCONIA;

EPITAXIAL FILMS;

EID: 84874511927     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2012.11.069     Document Type: Article

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