Low-threshold and quasi-single-mode random laser within a submicrometer-sized ZnO spherical particle film

Applied Physics Letters

Volumn 102, Issue 6, 2013, Pages

  Fujiwara, Hideki ^a   Niyuki, Ryo ^a   Ishikawa, Yoshie ^b   Koshizaki, Naoto ^c   Tsuji, Takeshi ^d   Sasaki, Keiji ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

^b KAGAWA UNIVERSITY   (Japan)

^c NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^d KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT SITES; DEFECT-FREE; EMISSION SPECTRUMS; LASING PROPERTIES; LASING THRESHOLD; LOW THRESHOLDS; MULTIMODES; POLYMER PARTICLES; RANDOM LASERS; RANDOM LASING; RANDOM STRUCTURES; SIMPLE STRUCTURES; SPHERICAL PARTICLE; ZINC OXIDE PARTICLES; ZNO;

DEFECTS; EMISSION SPECTROSCOPY; POINT DEFECTS; ZINC OXIDE;

LASER BEAMS;

EID: 84874224817     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4792349     Document Type: Article

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