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Volumn 6, Issue 2, 2013, Pages

A comparative computational study of structures, diffusion, and dopant interactions between li and na insertion into Si

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE/DISCHARGE; COMPUTATIONAL STUDIES; DIFFUSION RATE; INTERSTITIAL DEFECTS; ION CONCENTRATIONS; MIGRATION BARRIERS; SI MATRIX; TETRAGONAL SITES;

EID: 84873949801     PISSN: 18820778     EISSN: 18820786     Source Type: Journal    
DOI: 10.7567/APEX.6.027301     Document Type: Article
Times cited : (81)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.