Handbook Of Instrumentation And Techniques For Semiconductor Nanostructure Characterization (In 2 Volumes)

Handbook Of Instrumentation And Techniques For Semiconductor Nanostructure Characterization (In 2 Volumes)

Volumn , Issue , 2011, Pages 1-680

  Haight, Richard ^a   Ross, Frances M ^a   Hannon, James B ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

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EID: 84873933125     PISSN: None     EISSN: None     Source Type: Book    
DOI: None     Document Type: Book

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