Garbage collection policy to improve durability for flash memory

IEEE Transactions on Consumer Electronics

Volumn 58, Issue 4, 2012, Pages 1232-1236

  Xu, Guangxia ^a   Liu, Yanbing ^a   Zhang, Xiaoqin ^b   Lin, Mingwei ^b  

^a CHONGQING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS   (China)

^b CHONGQING UNIVERSITY   (China)

Author keywords

Consumerelectronic; Flash memory; Garbage collection

Indexed keywords

DESIGN PRINCIPLES; ERASE OPERATION; FREE SPACES; GARBAGE COLLECTION; SELECTION METHODS; UPDATE SCHEMES;

CONSUMER ELECTRONICS; DURABILITY; REFUSE COLLECTION;

FLASH MEMORY;

EID: 84873831416     PISSN: 00983063     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCE.2012.6414990     Document Type: Article

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