Overview of the TREC 2007 enterprise track

NIST Special Publication

Volumn , Issue , 2007, Pages

  Bailey, Peter ^a   Craswell, Nick ^b   De Vries, Arjen P ^c   Soboroff, Ian ^d  

^a MICROSOFT   (United States)

^b MSR   (United Kingdom)

^c CWI   (Netherlands)

^d NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCHES; DEVELOPMENT PROCESS; DOCUMENT SEARCH; EXPERT SEARCHES; PREVIOUS YEAR; RELEVANCE FEEDBACK; SCIENCE COMMUNICATORS; SEARCH ACTIVITY;

INDUSTRY;

INFORMATION RETRIEVAL;

EID: 84873435548     PISSN: 1048776X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. P. Bailey, N. Craswell, I. Soboroff, and A.P. de Vries. The CSIRO enterprise search test collection. SIGIR Forum, 41(2):42-45, 2007.
2. P. Bailey, N. Craswell, I. Soboroff, P. Thomas, A.P. de Vries, and E. Yilmaz. Relevance assessment: are judges exchangeable and does it matter? In Proceedings of the 31st Annual International ACM SIGIR Conference, Singapore, July 20-24 2008. To appear.