In situ calibration of an extreme ultraviolet spectrometer for attosecond transient absorption experiments

Applied Optics

Volumn 52, Issue 3, 2013, Pages 323-329

  Wang, Xiaowei ^a,b   Chini, Michael ^b   Cheng, Yan ^b   Wu, Yi ^b   Chang, Zenghu ^b  

^a NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY   (China)

^b UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTIC EQUIPMENT; RESONANCE; SPECTROMETERS;

ABSORPTION LINE PROFILES; ABSORPTION LINES; AUTOIONIZING STATE; EXTREME ULTRAVIOLET SPECTROMETERS; FANO RESONANCES; GRAZING INCIDENCE; IN-SITU CALIBRATION; TRANSIENT ABSORPTION;

ULTRAVIOLET SPECTROMETERS;

EID: 84873205874     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.52.000323     Document Type: Article

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