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Volumn , Issue , 2012, Pages 1092-1095
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OMPS early orbit dark and bias evaluation and calibration
a b c b c b d e f g
g
IIS
(United States)
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Author keywords
calibration; CCD; dark current; OMPS
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Indexed keywords
BIAS PARAMETERS;
BIAS SIGNAL;
ELECTRICAL BIAS;
ENERGETIC PARTICLES;
GENERAL TRENDS;
HOT PIXELS;
INTERNAL CONSISTENCY;
LATTICE DAMAGE;
OMPS;
ON-ORBIT;
ORBIT CALIBRATION;
PIXEL COUNT;
SENSOR DATA RECORDS;
SOUTH ATLANTIC ANOMALIES;
SYSTEM LEVELS;
TEMPERATURE DEPENDENCIES;
CALIBRATION;
CHARGE COUPLED DEVICES;
DARK CURRENTS;
DIGITAL STORAGE;
GEOLOGY;
OZONE;
REMOTE SENSING;
PIXELS;
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EID: 84873121940
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/IGARSS.2012.6351358 Document Type: Conference Paper |
Times cited : (6)
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References (2)
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