Properties of NiO sputtered thin films and modeling of their sensing mechanism under formaldehyde atmospheres

Acta Materialia

Volumn 61, Issue 4, 2013, Pages 1146-1153

  Castro Hurtado, I ^a   Malagu C ^b,c   Morandi, S ^d   Perez N ^a   Mandayo, G G ^a   Castano E ^a  

^a CEIT   (Spain)

^b UNIVERSITY OF FERRARA   (Italy)

^c IDASC Istituto di Acustica e Sensoristica O M Corbino   (Italy)

^d UNIVERSITY OF TURIN   (Italy)

Author keywords

Formaldehyde; Gas sensor; NiO; p Type; Surface barrier

Indexed keywords

ANNEALING TREATMENTS; CONDUCTANCE MEASUREMENT; FOURIER; GAS DETECTION; NIO; NIO THIN FILM; OPTICAL AND ELECTRICAL PROPERTIES; P-TYPE; POTENTIAL BARRIER HEIGHT; POTENTIAL BARRIERS; SEMI-CONDUCTOR SURFACES; SENSING LAYERS; SENSING MECHANISM; SPUTTERED THIN FILMS; SURFACE BARRIER; TEMPERATURE RANGE;

CHEMICAL SENSORS; FORMALDEHYDE; GAS DETECTORS; NUCLEAR PHYSICS; THIN FILMS;

ELECTRIC PROPERTIES;

EID: 84873096234     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2012.10.024     Document Type: Article

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