Smooth surface roughness of silanized CdSe(ZnS) quantum dots

Journal of Colloid and Interface Science

Volumn 393, Issue 1, 2013, Pages 21-28

  Xu, Jianmin ^a,d   Wang, Chengshan ^b,d   Wang, Jinhai ^c   Huo, Qun ^c   Crawford, Nicholas F ^d   Véliz, Eduardo A ^d,e   Leblanc, Roger M ^d  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b MIDDLE TENNESSEE STATE UNIVERSITY   (United States)

^c UNIVERSITY OF CENTRAL FLORIDA   (United States)

^d Department of Biology   (United States)

^e NOVA SOUTHEASTERN UNIVERSITY   (United States)

Author keywords

Langmuir monolayer; Langmuir Blodgett films; Quantum dots; Sol gel process

Indexed keywords

AIR WATER INTERFACES; CDSE; CONDUCTION PROPERTIES; INTERPARTICLE DISTANCES; LANGMUIR MONOLAYERS; PHOTOEXCITED ELECTRONS; PHOTOEXCITED HOLES; PILOT STUDIES; RESEARCH STRATEGY; SURFACE SMOOTHNESS;

CADMIUM ALLOYS; CADMIUM COMPOUNDS; INTERFACES (MATERIALS); LANGMUIR BLODGETT FILMS; MICA; MONOLAYERS; POLYMERS; SEMICONDUCTING SILICON; SILICON COMPOUNDS; SOL-GEL PROCESS; SURFACE ROUGHNESS; SURFACES; ZINC SULFIDE;

SEMICONDUCTOR QUANTUM DOTS;

CADMIUM SELENIDE; MICA; QUANTUM DOT; SILANE DERIVATIVE; ZINC SULFIDE;

ACCURACY; ARTICLE; CONTROLLED STUDY; LANGMUIR BLODGETT FILM; PILOT STUDY; POLYMERIZATION; PRIORITY JOURNAL; SEMICONDUCTOR; SURFACE PROPERTY;

CADMIUM COMPOUNDS; MOLECULAR STRUCTURE; PARTICLE SIZE; QUANTUM DOTS; SELENIUM COMPOUNDS; SILANES; SULFIDES; SURFACE PROPERTIES; ZINC COMPOUNDS;

EID: 84873060761     PISSN: 00219797     EISSN: 10957103     Source Type: Journal    
DOI: 10.1016/j.jcis.2012.10.054     Document Type: Article

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