Evolution of the structure and properties of solution-based Ge 23Sb7S70 thin films during heat treatment

Materials Research Bulletin

Volumn 48, Issue 3, 2013, Pages 1250-1255

  Novak, Jacklyn ^a,b   Novak, Spencer ^a,b   Dussauze, Marc ^b   Fargin, Evelyne ^b   Adamietz, Frédéric ^b   Musgraves, J David ^a   Richardson, Kathleen ^a  

^a Clemson University   (United States)

^b UNIVERSITÉ DE BORDEAUX   (France)

Author keywords

A. Amorphous material; A. Chalcogenides; B. Chemical synthesis; C. Atomic force microscopy; C. Infrared spectroscopy

Indexed keywords

ATOMIC LEVELS; BAND GAP ENERGY; CHALCOGENIDE FILMS; CHEMICAL PROCESS; CHEMICAL SYNTHESIS; FILM DEPOSITION; GLASS STRUCTURE; IN-SITU FT-IR; SOLVENT REMOVAL; STRUCTURAL ASPECTS; STRUCTURE AND PROPERTIES; UV-VISIBLE ABSORPTION SPECTROSCOPY;

ANTIMONY; ATOMIC FORCE MICROSCOPY; CHALCOGENIDES; GERMANIUM; GLASS; PHOTOLITHOGRAPHY; REFRACTIVE INDEX; SURFACE ROUGHNESS;

HEAT TREATMENT;

EID: 84872868068     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2012.12.008     Document Type: Article

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