New sample holder geometry for high precision isotope analyses

Surface and Interface Analysis

Volumn 45, Issue 1, 2013, Pages 553-556

  Peres, P ^a   Kita, N T ^b   Valley, J W ^b   Fernandes, F ^a   Schuhmacher, M ^a  

^a CAMECA   (United States)

^b UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

CAMECA; geology; geosciences; IMS 1280; IMS 1280 HR; ion microprobe; isotope ratios; oxygen; sample holder; SIMS; stable isotopes; X Y effects

Indexed keywords

CAMECA; GEOSCIENCES; IMS 1280; IMS 1280-HR; ION MICROPROBE; ISOTOPE RATIO; SAMPLE HOLDERS; STABLE ISOTOPES; X-Y EFFECTS;

GEOLOGY; ION MICROSCOPES; OXYGEN; SECONDARY ION MASS SPECTROMETRY;

ISOTOPES;

EID: 84872857047     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.5061     Document Type: Conference Paper

References (8)

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