-
9
-
-
16344377415
-
-
J. Li, F.X. Zhang, Y.W. Ren, Y.Q. Hun, Y.F. Nan, Thermochim. Acta, 406 (2003): 77-87
-
(2003)
Thermochim. Acta
, vol.406
, pp. 77-87
-
-
Li, J.1
Zhang, F.X.2
Ren, Y.W.3
Hun, Y.Q.4
Nan, Y.F.5
-
12
-
-
0003462862
-
-
M. O'Reilly, X. Jiang, J.T. Beechinor, S. Lynch, C. NiDheasuna, J.C. Patterson, G.M. Crean, Appl. Surf. Sci., 91(1995): 152-156
-
(1995)
Appl. Surf. Sci.
, vol.91
, pp. 152-156
-
-
O'reilly, M.1
Jiang, X.2
Beechinor, J.T.3
Lynch, S.4
NiDheasuna, C.5
Patterson, J.C.6
Crean, G.M.7
-
15
-
-
77952135432
-
Standard test method for coulometric reduction of surface films on metallic test samples
-
ASTM B825, ASTM, Philadelphia, PA
-
'Standard test method for coulometric reduction of surface films on metallic test samples', in 'Annual book of ASTM standards', ASTM B825, ASTM, Philadelphia, PA, 2007
-
(2007)
Annual book of ASTM standards
-
-
-
18
-
-
0029344869
-
Coulometric reduction of oxides formed on copper, nickel and iron
-
Sungkyu Lee, Roger W. Staehle, Coulometric reduction of oxides formed on copper, nickel and iron, J. Electrochem. Soc., 142 (1995): 2189-2195
-
(1995)
J. Electrochem. Soc.
, vol.142
, pp. 2189-2195
-
-
Lee, S.1
Staehle, W.R.2
-
19
-
-
72249093573
-
-
K. Demirkan, G. E. Derkits, Jr., D. A. Fleming, J. P. Franey, K. Hannigan, R. L. Opila, J. Punch, W. D. Reents, Jr., M. Reid, B. Wright, C. Xu, J. Electrochem. Soc., 157 (2010): C30-C35
-
(2010)
J. Electrochem. Soc.
, vol.157
-
-
Demirkan, K.1
Derkits Jr., G.E.2
Fleming, D.A.3
Franey, J.P.4
Hannigan, K.5
Opila, R.L.6
Punch, J.7
Reents, W.D.8
Reid Jr., M.9
Wright, B.10
Xu, C.11
-
25
-
-
33947154955
-
-
J.M.M. Droog, C.A.Alderliesten, P.T. Alderliesten, G.A. Bootsma, J. Electroanal. Chem. Interfacial Electrochem., 111(1980): 61-70
-
(1980)
J. Electroanal. Chem. Interfacial Electrochem.
, vol.111
, pp. 61-70
-
-
Droog, J.M.M.1
Alderliesten, C.A.2
Alderliesten, P.T.3
Bootsma, G.A.4
-
26
-
-
0020495423
-
-
D.W. Shoesmith, S. Sunder, M.G. Bailey, G.J. Wallace, F.W. Stanchell, J. Electroanal. Chem. Interfacial Electrochem., 143 (1983): 153-165
-
(1983)
J. Electroanal. Chem. Interfacial Electrochem.
, vol.143
, pp. 153-165
-
-
Shoesmith, D.W.1
Sunder, S.2
Bailey, M.G.3
Wallace, G.J.4
Stanchell, F.W.5
-
27
-
-
84858619932
-
-
F. Rosalbino, R. Carlini, F. Soggia, G. Zanicchi, G. Scavino, Corros. Sci.,58 (2012): 139-144
-
(2012)
Corros. Sci.
, vol.58
, pp. 139-144
-
-
Rosalbino, F.1
Carlini, R.2
Soggia, F.3
Zanicchi, C.4
Scavino, G.5
-
29
-
-
80655148963
-
-
H.M. Hollmark, P.G. Keech, J.R. Vegelius, L. Wermea, L.-C. Duda, Corros. Sci., 54 (2012): 85-89
-
(2012)
Corros. Sci.
, vol.54
, pp. 85-89
-
-
Hollmark, H.M.1
Keech, P.G.2
Vegelius, J.R.3
Wermea, L.4
Duda, L.-C.5
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