Erratum: Scherrer grain-size analysis adapted to grazing-incidence scattering with area detectors (Journal of Applied Crystallography (2009) 42 (1030-1034))

Journal of Applied Crystallography

Volumn 46, Issue 1, 2013, Pages 286-

  Smilgies, Detlef M ^a  

^a Department of Obstetrics Gynecology   (United States)

Author keywords

grazing incidence small angle scattering (GISAXS); grazing incidence wide angle scattering (GIWAXS); Scherrer formula; soft materials; thin films

Indexed keywords

EID: 84872725404     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889812050054     Document Type: Erratum

References (2)

1. Kazimirov, A., Smilgies, D.-M., Shen, Q., Xiao, X., Hao, Q., Fontes, E., Bilderback, D. H., Gruner, S. M., Platonov, Y. & Martynov, V. V. (2006). J. Synchrotron Rad. 13, 204-210.
2. Smilgies, D.-M. (2009). J. Appl. Cryst. 42, 1030-1034.