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Volumn 8504, Issue , 2012, Pages
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X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
[No Author Info available]
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 84872590395
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Review |
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Times cited : (1)
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References (0)
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