Root cause determination of on-orbit degradation of the VIIRS rotating telescope assembly

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8510, Issue , 2012, Pages

  Barrie, J D ^a   Fuqua, P D ^a   Meshishnek, M J ^a   Ciofalo, M R ^a   Chu, C T ^a   Chaney, J A ^a   Moision, R M ^a   Graziani, L ^b  

^a AEROSPACE CORPORATION   (United States)

^b NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

Contamination; Mirror; Photo darkening; Suomi NPP; Tungsten oxide; VIIRS

Indexed keywords

CONTAMINANT FILMS; LABORATORY INVESTIGATIONS; MANUFACTURING PROCESS; NEAR-INFRARED BANDS; ON-ORBIT; OPTICAL THROUGHPUT; PRIMARY SOURCES; ROOT CAUSE; SUOMI NPP; TUNGSTEN OXIDE; ULTRA-VIOLET LIGHT; VIIRS; VISIBLE INFRARED IMAGING RADIOMETER SUITES;

CONTAMINATION; EXPERIMENTS; INFRARED IMAGING; MIRRORS; OXIDES; PHOTOCHROMISM; TELESCOPES; TUNGSTEN COMPOUNDS; ULTRAVIOLET RADIATION;

OPTICAL TELESCOPES;

EID: 84872560517     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.933276     Document Type: Conference Paper

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