Linear magnetoresistance in topological insulator thin films: Quantum phase coherence effects at high temperatures

Applied Physics Letters

Volumn 102, Issue 1, 2013, Pages

  Assaf, B A ^a   Cardinal, T ^a   Wei, P ^b   Katmis, F ^b,c   Moodera, J S ^b,c   Heiman, D ^a  

^a NORTHEASTERN UNIVERSITY   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^c MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENCE LENGTHS; HIGH TEMPERATURE; HIGH-FIELD; IN-FIELD; LINEAR MAGNETORESISTANCE; LOW MAGNETIC FIELDS; LOW TEMPERATURES; MEAN FREE PATH; PHASE COHERENCE; QUADRATIC COMPONENTS; QUANTUM PHASE; TOPOLOGICAL INSULATORS; WEAK ANTILOCALIZATION;

ELECTRIC INSULATORS; MAGNETORESISTANCE;

SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 84872364146     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4773207     Document Type: Article

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