Adsorption tests

Nuclear Engineering International

Volumn 58, Issue 702, 2013, Pages 34-35

  Kim, Jungseung ^a   Tsouris, Costas ^a   Oyola, Yatsandra ^a   Mayes, Richard ^a   Hexel, Cole ^a   Janke, Christopher ^a   Dai, Sheng ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

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EID: 84872317569     PISSN: 00295507     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

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