Dielectric and Raman scattering studies of Bi2WO6 single crystals

Phase Transitions

Volumn 86, Issue 2-3, 2013, Pages 290-300

  Kania, Antoni ^a   Niewiadomski, Adrian ^a   Kugel, Godefroy E ^b  

^a UNIVERSITY OF SILESIA   (Poland)

^b UNIVERSITÉ DE LORRAINE   (France)

Author keywords

Bi2WO6; bismuth tungstate; crystal growth; dielectric properties; Raman scattering; soft mode

Indexed keywords

BISMUTH TUNGSTATES; DIELECTRIC PERMITTIVITIES; DIELECTRIC STUDIES; FLUX METHODS; LOCAL MAXIMUM; POLAR AXIS; RAMAN EXPERIMENTS; RAMAN LINES; SOFT MODES; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE;

BISMUTH; CRYSTAL GROWTH; DIELECTRIC PROPERTIES; PERMITTIVITY; SINGLE CRYSTALS; TUNGSTEN COMPOUNDS;

RAMAN SCATTERING;

EID: 84872307415     PISSN: 01411594     EISSN: 10290338     Source Type: Journal    
DOI: 10.1080/01411594.2012.715295     Document Type: Conference Paper

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