Scan registration with multi-scale k-means normal distributions transform

IEEE International Conference on Intelligent Robots and Systems

Volumn , Issue , 2012, Pages 2705-2710

  Das, Arun ^a   Waslander, Steven L ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CLUSTER SIZES; INITIAL PARAMETER; K-MEANS; K-MEANS CLUSTERING; LOCAL MINIMUMS; MULTIPLE SCALE; MULTISCALES; POINT CLOUD; REGISTRATION ALGORITHMS; TRANSFORMATION ERRORS;

ALGORITHMS; INTELLIGENT SYSTEMS; OPTIMIZATION;

NORMAL DISTRIBUTION;

EID: 84872294272     PISSN: 21530858     EISSN: 21530866     Source Type: Conference Proceeding    
DOI: 10.1109/IROS.2012.6386185     Document Type: Conference Paper

References (10)

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