Carbon nanofiber nanoelectrode array: Effect of process conditions on reliability

IEEE Transactions on Nanotechnology

Volumn 12, Issue 1, 2013, Pages 101-107

  Wejinya, Uchechukwu C ^a   Chalamalasetty, Siva Naga Sandeep ^b   Dong, Zhuxin ^a   Arumugam, Prabhu U ^c,d   Meyyappan, Meyya ^c  

^a University of Arkansas   (United States)

^b UNIVERSITY OF ARKANSAS   (United States)

^c NASA AMES RESEARCH CENTER   (United States)

^d ADVANCED DIAMOND TECHNOLOGIES INC   (United States)

Author keywords

Carbon nanofiber (CNF); process conditions; reliability; statistical analysis

Indexed keywords

AFM; BIO-SENSOR SYSTEMS; BIOSENSING APPLICATIONS; EFFECT OF TEMPERATURE; ELECTRODE MATERIAL; NANOELECTRODE ARRAY; PATTERNED SUBSTRATES; PROCESS CONDITION; SAMPLE HANDLING; SYSTEM INTEGRATION; TAGUCHI APPROACH;

ATOMIC FORCE MICROSCOPY; BIOSENSORS; RELIABILITY; STATISTICAL METHODS; TEMPERATURE;

CARBON NANOFIBERS;

EID: 84872133346     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2012.2227496     Document Type: Article

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