Line scratches detection and restoration via light diffraction

International Symposium on Image and Signal Processing and Analysis, ISPA

Volumn 1, Issue , 2003, Pages 5-10

  Bruni, V ^a   Vitulano, D ^a   Kokaram, A ^b  

^a CNR   (Italy)

^b TRINITY COLLEGE DUBLIN   (Ireland)

Author keywords

Brightness; Charge coupled devices; Degradation; Diffraction; Digital images; Educational institutions; Image restoration; Optical arrays; Parameter estimation; Proposals

Indexed keywords

CHARGE COUPLED DEVICES; DEGRADATION; DIFFRACTION; DIGITAL DEVICES; IMAGE ANALYSIS; IMAGE PROCESSING; IMAGE RECONSTRUCTION; LUMINANCE; PARAMETER ESTIMATION; RESTORATION; SIGNAL DETECTION;

DIFFRACTION OF LIGHTS; DIGITAL IMAGE; EDUCATIONAL INSTITUTIONS; LIGHT DIFFRACTION; OPTICAL ARRAYS; PHYSICAL MODELLING; PROPOSALS; UNIFIED MODELING;

SIGNAL PROCESSING;

EID: 84872088682     PISSN: 18455921     EISSN: 18492266     Source Type: Conference Proceeding    
DOI: 10.1109/ISPA.2003.1296858     Document Type: Conference Paper

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