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Volumn 38, Issue 1, 2013, Pages 169-174

Characterization of Nanocrystalline Lead Sulphide Thin Films Prepared by Chemical Bath Deposition Technique

Author keywords

Nanocrystalline; Semiconductor; Thin film; X ray fluorescence; XRD

Indexed keywords


EID: 84871998440     PISSN: 2193567X     EISSN: 21914281     Source Type: Journal    
DOI: 10.1007/s13369-012-0390-3     Document Type: Article
Times cited : (18)

References (24)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.