Nanoscale fluctuations and surface tension measurements in droplets using phase-resolved low-coherence interferometry

Applied Optics

Volumn 52, Issue 1, 2013, Pages

  Wang, Ru ^a   Kim, Taewoo ^a   Mir, Mustafa ^a   Popescu, Gabriel ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DROPS; FLUID MECHANICS; LIGHT SCATTERING; NANOTECHNOLOGY; OPTICAL FIBERS; PHASE MEASUREMENT; SURFACE TENSION;

COMMON-PATH INTERFEROMETERS; DYNAMIC LIGHT SCATTERING MEASUREMENT; LOW COHERENCE INTERFEROMETRY; NANOSCALE DISPLACEMENT; NANOSCALE FLUCTUATIONS; QUANTITATIVE PHASE MEASUREMENT; SURFACE TENSION MEASUREMENTS; THERMAL FLUCTUATIONS;

INTERFEROMETRY;

NANOMATERIAL;

ARTICLE; CHEMISTRY; EQUIPMENT; EQUIPMENT DESIGN; EQUIPMENT FAILURE; INTERFEROMETRY; MICROFLUIDICS; NANOTECHNOLOGY; SENSITIVITY AND SPECIFICITY; SOLUTION AND SOLUBILITY; SURFACE TENSION; ULTRASTRUCTURE;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; INTERFEROMETRY; MICROCHEMISTRY; MICROFLUIDICS; NANOSTRUCTURES; NANOTECHNOLOGY; SENSITIVITY AND SPECIFICITY; SOLUTIONS; SURFACE TENSION;

EID: 84871956640     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.52.00A177     Document Type: Conference Paper

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