Investigation of structural, optical and electronic properties in Al-Sn co-doped ZnO thin films

Applied Surface Science

Volumn 265, Issue , 2013, Pages 870-877

  Pan, Zhanchang ^a   Tian, Xinlong ^a   Wu, Shoukun ^b   Yu, Xia ^a   Li, Zhuliang ^b   Deng, Jianfeng ^b   Xiao, Chumin ^a   Hu, Guanghui ^a   Wei, Zhigang ^a  

^a GUANGDONG UNIVERSITY OF TECHNOLOGY   (China)

^b Huizhou King Brother Electronic Technology Co Ltd Ltd   (China)

Author keywords

Al Sn co doped ZnO; Optical bandgap; Sol gel method; XPS

Indexed keywords

ALUMINUM COMPOUNDS; BINARY ALLOYS; ELECTRONIC PROPERTIES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; II-VI SEMICONDUCTORS; METALLIC FILMS; OPTICAL BAND GAPS; OPTICAL FILMS; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS; SOL-GELS; SUBSTRATES; THIN FILMS; TIN; X RAY DIFFRACTION; ZINC OXIDE;

AL-SN CO-DOPED ZNO; ELECTRICAL AND OPTICAL PROPERTIES; OPTICAL AND ELECTRONIC PROPERTIES; PREFERRED ORIENTATIONS; ROOM-TEMPERATURE PHOTOLUMINESCENCE; SOL-GEL PROCESSING; STRUCTURE AND MORPHOLOGY; X-RAY PHOTOELECTRON SPECTROSCOPY STUDIES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84871929207     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2012.11.139     Document Type: TB

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