Application of atomic force microscopy in ion exchange membrane technology

Research Journal of Chemistry and Environment

Volumn 16, Issue 4, 2012, Pages 145-148

  Chunjie, Han ^a  

^a NORTHEAST PETROLEUM UNIVERSITY   (China)

Author keywords

Atomic force microscopy; Different phase polyethylene ion exchange membrane; Roughness

Indexed keywords

ATOMIC FORCE MICROSCOPY; DATA SET; ETHYLENE; ION EXCHANGE; MEMBRANE; PARAMETERIZATION; RESEARCH WORK; ROUGHNESS;

EID: 84871825748     PISSN: 09720626     EISSN: 22784527     Source Type: Journal    
DOI: None     Document Type: Article

References (4)

1. Binning G.C.F., Atomic Force Microscope, Physics Review Letter, (4), 930-933 (1986)
2. Jing Guolin, Wang Xiaoyu and Zhao Hai, Study on fouling of ion exchange membranes used for oil-field wastewater, Acta Scientiae Circumstantia, 27(8), 1251-1255 (2006)
3. Han Xian-Wu, Chen Xiao-An, Yang Xue-Heng and Bai Hai-Hui, Nanometer Scale Surface Roughness Measurement Based on AFM, Journal of Chongqing University (Natural Science Edition), 30(2), 5-8 (2007)
4. Li Hui-Qin and Zhang Yu-Zhong, Study of pva membrane structure with atomic force microscope, Technology of Water Treatment, 32(4), 27-29 (2006).