A thermal stress test of the depth-graded Pt/C Re ectors used in the ASTRO-H hard x-ray telescope (HXT)

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8443, Issue , 2012, Pages

  Maeda, Yoshitomo ^a   Ichihara, Kou ^a   Shionome, Yu ^a   Sato, Takuro ^a   Hayashi, Takayuki ^a   Ishida, Manabu ^a   Kan, Hiroaki ^a,b   Namba, Yoshiharu ^c   Takahashi, HIdeaki ^c   Miyazawa, Takuya ^d   Ishibashi, Kazunori ^d   Sakai, MIchito ^d   Sugita, Satoshi ^d   Haba, Yoshito ^d   Matsumoto, Hironori ^d   Mori, Hideyuki ^a  

^a JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

^b OSAKA UNIVERSITY   (Japan)

^c CHUBU UNIVERSITY   (Japan)

^d NAGOYA UNIVERSITY   (Japan)

Author keywords

ASTRO H; Hard X ray Telescope; X ray Optics

Indexed keywords

ALUMINUM SUBSTRATE; ASTRO-H; CYLINDRICAL MANDREL; EPOXY LAYERS; HARD X RAY; HARD X-RAY TELESCOPE; SCALE LENGTH; TELESCOPE SYSTEM; TEMPERATURE RANGE; THERMAL DESIGNS; TYPICAL SCALE; X RAY REFLECTIVITY; X-RAY REFLECTIVE;

ALUMINUM; GAMMA RAYS; PLATINUM ALLOYS; REFLECTION; SPACE TELESCOPES; THERMAL STRESS;

X RAYS;

EID: 84871767664     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.925847     Document Type: Conference Paper

References (5)

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